Lab Characterization

Ashtronix Lab Characterization Services

Efficiency Testing:
Efficiency is one of the most critical aspects of power management ICs, as it directly affects power consumption, heat dissipation, and the overall performance of the end device. During efficiency testing, the company assesses the IC’s ability to convert input power into usable output power with minimal losses.

1. Power Conversion Efficiency: This involves measuring how effectively the IC converts electrical power from one form to another, typically from higher to lower voltages or between AC and DC power. High-efficiency PMICs ensure minimal energy loss, which is essential in battery-powered devices like smartphones and electric vehicles, where battery life and thermal management are critical.
2.Load Regulation: The IC is tested under various load conditions to measure how efficiently it maintains output voltage stability when the load changes. A good PMIC should efficiently manage varying loads without significant drops in performance.
3.Thermal Efficiency: In addition to electrical efficiency, the IC’s ability to manage heat is also assessed. High temperatures can degrade the IC’s performance or cause failures, so efficiency testing often includes thermal profiling to ensure the IC operates within safe temperature ranges, even under heavy loads.
4. Energy Efficiency Standards: The PMIC must comply with energy efficiency standards, especially for devices targeting consumer electronics or automotive applications. During efficiency testing, the IC is evaluated to ensure it meets these regulatory standards, which are often required for certifications like Energy Star or automotive-grade certifications.

Transient Response Testing:
Transient response testing measures how quickly and accurately the PMIC responds to sudden changes in load or input voltage. In many applications, especially those involving high-performance computing, IoT, or automotive systems, rapid and unpredictable fluctuations in power demand are common. The PMIC’s ability to respond to these fluctuations without compromising system stability is crucial.

1. Load Transients: This test evaluates how quickly and efficiently the IC can adjust its output voltage in response to sudden changes in load, such as when a processor or other components switch between low-power and high-power states. A fast and stable transient response ensures the overall system maintains performance without power surges or voltage drops that could cause instability or data loss.
2.Line Transients: In addition to load changes, line transient testing assesses the IC’s ability to handle fluctuations in input voltage, which can occur due to power supply noise, grid instability, or other external factors. The PMIC must maintain a stable output voltage during these line transients to protect sensitive electronics from damage.
3. Recovery Time: The IC is tested for how quickly it can return to a steady state after a transient event. Short recovery times are essential to avoid prolonged instability, especially in systems requiring real-time performance, such as automotive and industrial applications.
4.Voltage Overshoot and Undershoot: During a transient event, it’s important that the output voltage does not overshoot (exceed the target voltage) or undershoot (drop below the target voltage) significantly. The company tests for these conditions to ensure the IC’s performance remains within safe operational limits and that the power supplied to the components does not cause malfunctions or damage.

Comprehensive Post-Silicon Testing Process:
In addition to the specific tests for efficiency and transient response, post-silicon validation often includes:

1. Stress Testing Under Extreme Conditions: The IC is tested under a wide range of temperatures, voltages, and operating conditions to simulate harsh environments. For example, in automotive or aerospace applications, the IC might need to perform well from -40°C to 150°C.
2. Durability and Reliability Testing: Long-term stress tests ensure the IC can handle extended periods of operation without degradation. This includes running the IC at maximum power or in thermally stressful environments for prolonged periods.
3. Electromagnetic Interference (EMI) Testing: The IC is evaluated for its susceptibility to and emissions of electromagnetic interference, which could affect other components or systems in the device.)